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Journal of Microscopy|March 22, 2014
Backscattered electron SEM imaging of cells and determination of the information depthJ Seiter, E Müller, H Blank, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2010
Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscopeT Volkenandt, E Müller, D Z Hu, et al.Ultramicroscopy|December 28, 2010
Object-wave reconstruction by carbon film-based Zernike- and Hilbert-phase plate microscopy: a theoretical study not restricted to weak-phase objectsM Dries, K Schultheiss, B Gamm, et al.Ultramicroscopy|September 5, 2006
Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plateE Majorovits, B Barton, K Schultheiss, et al.Scientific Reports|May 23, 2018
Correlating the nanostructure of Al-oxide with deposition conditions and dielectric contributions of two-level systems in perspective of superconducting quantum circuitsS Fritz, A Seiler, L Radtke, et al.Nanotechnology|May 7, 2009
The structure and optical properties of ZnO nanocrystals embedded in SiO2 fabricated by radio-frequency sputteringG Mayer, M Fonin, U Rüdiger, et al.Journal of Microscopy|April 12, 2001
Autocorrelation spectroscopy on single ultrathin layers of CdSe/ZnSe: hints for a non-thermal distribution of excitons in quantum islandsG Von Freymann, E Kurtz, C Klingshirn, et al.Ultramicroscopy|March 2, 2010
Object wave reconstruction by phase-plate transmission electron microscopyB Gamm, M Dries, K Schultheiss, et al.Ultramicroscopy|February 22, 2014
A nanocrystalline Hilbert phase-plate for phase-contrast transmission electron microscopyM Dries, S Hettler, B Gamm, et al.Ultramicroscopy|April 1, 2018
Oxide-free aC/Zr0.65Al0.075Cu0.275/aC phase plates for transmission electron microscopyM Dries, M Obermair, S Hettler, et al.Pageof 3