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Surface & Coatings Technology|April 22, 2014
Structural and mechanical evolution of reactively and non-reactively sputtered Zr-Al-N thin films during annealingP H Mayrhofer, D Sonnleitner, M Bartosik, et al.Ultramicroscopy|April 21, 2009
HANSIS software tool for the automated analysis of HOLZ linesD Holec, D V Sridhara Rao, C J HumphreysCurrent HIV Research|November 23, 2017
Nucleotide Reverse Transcriptase Inhibitors: A Thorough Review, Present Status and Future Perspective as HIV TherapeuticsAshley D Holec, Subhra Mandal, Pavan Kumar Prathipati, et al.Micron (Oxford, England : 1993)|November 27, 2007
Electron energy loss near edge structure (ELNES) spectra of AlN and AlGaN: a theoretical study using the Wien2k and Telnes programsD Holec, P M F J Costa, P D Cherns, et al.The Review of Scientific Instruments|July 2, 2010
Imaging dislocations in gallium nitride across broad areas using atomic force microscopyS E Bennett, D Holec, M J Kappers, et al.Acta Crystallographica. Section A, Foundations of Crystallography|June 18, 2010
Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaNB Jiang, J M Zuo, D Holec, et al.Scientific Reports|November 7, 2018
Self-structuring in Zr<sub>1-x</sub>Al<sub>x</sub>N films as a function of composition and growth temperatureN Ghafoor, I Petrov, D Holec, et al.Scientific Reports|December 7, 2018
Tuning structure and mechanical properties of Ta-C coatings by N-alloying and vacancy populationT Glechner, P H Mayrhofer, D Holec, et al.Acta Materialia|February 3, 2015
Complementary ab initio and X-ray nanodiffraction studies of Ta<sub>2</sub>O<sub>5.</sub>R Hollerweger, D Holec, J Paulitsch, et al.Pageof 1