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D J Taplin

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Ultramicroscopy|July 25, 2016
Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probesD J Taplin, N Shibata, M Weyland, et al.
Ultramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.
Ultramicroscopy|May 21, 2017
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metricJ A Pollock, M Weyland, D J Taplin, et al.
Ultramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.
Ultramicroscopy|January 11, 2022
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detectorT Mawson, D J Taplin, H G Brown, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|July 25, 2016
Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probesD J Taplin, N Shibata, M Weyland, et al.
Ultramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.
Ultramicroscopy|May 21, 2017
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metricJ A Pollock, M Weyland, D J Taplin, et al.
Ultramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.
Ultramicroscopy|January 11, 2022
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detectorT Mawson, D J Taplin, H G Brown, et al.
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