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D M Nminibapiel

Showing results (1-10 of 2) with videos related to

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IEEE Transactions on Nuclear Science|May 14, 2019
Total Ionizing Dose Effects on TiN/Ti/HfO<sub>2</sub>/TiN Resistive Random-Access Memory Studied via Electrically Detected Magnetic ResonanceD J McCrory, P M Lenahan, D M Nminibapiel, et al.
Solid-State Electronics|September 27, 2019
Parasitic engineering for RRAM controlP R Shrestha, D M Nminibapiel, D Veksler, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Nuclear Science|May 14, 2019
Total Ionizing Dose Effects on TiN/Ti/HfO<sub>2</sub>/TiN Resistive Random-Access Memory Studied via Electrically Detected Magnetic ResonanceD J McCrory, P M Lenahan, D M Nminibapiel, et al.
Solid-State Electronics|September 27, 2019
Parasitic engineering for RRAM controlP R Shrestha, D M Nminibapiel, D Veksler, et al.
Pageof 1