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The Review of Scientific Instruments|April 7, 2007
Near-infrared thermography using a charge-coupled device camera: application to microsystemsD Teyssieux, L Thiery, B CretinThe Review of Scientific Instruments|November 5, 2013
Quantitative thermal microscopy using thermoelectric probe in passive modeA Bontempi, L Thiery, D Teyssieux, et al.IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|August 2, 2001
Finite element analysis of the behavior of the Scanning Microdeformation MicroscopeP Vairac, S Ballandras, B CretinPageof 4