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Dae sil Kang

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Ultramicroscopy|August 2, 2015
A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tipKumjae Shin, Dae sil Kang, Sang hoon Lee, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Ultramicroscopy|August 2, 2015
A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tipKumjae Shin, Dae sil Kang, Sang hoon Lee, et al.
Pageof 1