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Daesuk Kim

Showing results (11-20 of 29) with videos related to

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Optics Express|December 10, 2008
High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometerJang-Woo You, Soohyun Kim, Daesuk Kim
Optics Express|December 24, 2008
Efficient double-filtering with a single acousto-optic tunable filterJang-Woo You, Jeongho Ahn, Soohyun Kim, et al.
Optics Letters|November 23, 2007
Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunablefilterDaesuk Kim, Soohyun Kim, Hong Jin Kong, et al.
Optics Express|February 7, 2018
Interferometric snapshot spectro-ellipsometryVamara Dembele, Moonseob Jin, Inho Choi, et al.
Optics Express|July 14, 2016
Dynamic spectro-polarimeter based on a modified Michelson interferometric schemeVamara Dembele, Moonseob Jin, Byung-Joon Baek, et al.
Optics Express|March 14, 2013
Complex object wave direct extraction method in off-axis digital holographyDaesuk Kim, Robert Magnusson, Moonseob Jin, et al.
Optics Letters|December 11, 2013
Calibration of a snapshot phase-resolved polarization-sensitive spectral reflectometerDaesuk Kim, Moonseob Jin, Won Chegal, et al.
Optics Express|February 4, 2009
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometerJang-Woo You, Daesuk Kim, Sung Yoon Ryu, et al.
Optics Letters|June 30, 2023
Untrained deep learning-based differential phase-contrast microscopyBaekcheon Seong, Ingyoung Kim, Taegyun Moon, et al.
Optics Express|November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency conceptDaesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Pageof 3

Showing results (11-20 of 29) with videos related to

Sort By:
Pageof 3
Optics Express|December 10, 2008
High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometerJang-Woo You, Soohyun Kim, Daesuk Kim
Optics Express|December 24, 2008
Efficient double-filtering with a single acousto-optic tunable filterJang-Woo You, Jeongho Ahn, Soohyun Kim, et al.
Optics Letters|November 23, 2007
Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunablefilterDaesuk Kim, Soohyun Kim, Hong Jin Kong, et al.
Optics Express|February 7, 2018
Interferometric snapshot spectro-ellipsometryVamara Dembele, Moonseob Jin, Inho Choi, et al.
Optics Express|July 14, 2016
Dynamic spectro-polarimeter based on a modified Michelson interferometric schemeVamara Dembele, Moonseob Jin, Byung-Joon Baek, et al.
Optics Express|March 14, 2013
Complex object wave direct extraction method in off-axis digital holographyDaesuk Kim, Robert Magnusson, Moonseob Jin, et al.
Optics Letters|December 11, 2013
Calibration of a snapshot phase-resolved polarization-sensitive spectral reflectometerDaesuk Kim, Moonseob Jin, Won Chegal, et al.
Optics Express|February 4, 2009
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometerJang-Woo You, Daesuk Kim, Sung Yoon Ryu, et al.
Optics Letters|June 30, 2023
Untrained deep learning-based differential phase-contrast microscopyBaekcheon Seong, Ingyoung Kim, Taegyun Moon, et al.
Optics Express|November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency conceptDaesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Pageof 3