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Scanning|June 18, 2009
Mistakes encountered during automatic peak identification of minor and trace constituents in electron-excited energy dispersive X-ray microanalysisDale E Newbury
Scanning|February 17, 2005
"Derived spectra" software tools for detecting spatial and spectral features in spectrum imagesDale E Newbury, David S Bright
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2016
Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!Dale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 2, 2022
Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited SpectraDale E Newbury, Nicholas W M Ritchie
Scanning|June 4, 2011
Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?Dale E Newbury, Nicholas W M Ritchie
Journal of Materials Science|September 9, 2015
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)Dale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
An Iterative Qualitative-Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap HaystackDale E Newbury, Nicholas W M Ritchie
Analytical Chemistry|October 24, 2012
Uncertainty estimates for electron probe X-ray microanalysis measurementsNicholas W M Ritchie, Dale E Newbury
Scanning|August 14, 2012
Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?Dale E Newbury, Nicholas W M Ritchie
MRS Advances|January 9, 2023
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platformDale E Newbury, Nicholas W M Ritchie
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