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Daohua Zhan

Showing results (1-10 of 6) with videos related to

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Micromachines|July 29, 2023
ATNet: A Defect Detection Framework for X-ray Images of DIP Chip Lead BondingRenbin Huang, Daohua Zhan, Xiuding Yang, et al.
Materials (Basel, Switzerland)|July 27, 2022
Surface Quality Control Strategy of Aspherical Mold Based on Screw Feed Polishing of Small Polishing ToolJiarong Zhang, Han Wang, Xiangyou Zhu, et al.
Micromachines|September 28, 2023
Convolutional Neural Network Defect Detection Algorithm for Wire Bonding X-ray ImagesDaohua Zhan, Renbin Huang, Kunran Yi, et al.
Micromachines|August 26, 2023
A High-Precision Multi-Beam Optical Measurement Method for Cylindrical Surface ProfileYinghong Zhou, Zhiliang Wu, Nian Cai, et al.
Materials (Basel, Switzerland)|April 13, 2023
Strip Surface Defect Detection Algorithm Based on YOLOv5Han Wang, Xiuding Yang, Bei Zhou, et al.
Micromachines|June 28, 2023
A Lightweight Method for Detecting IC Wire Bonding Defects in X-ray ImagesDaohua Zhan, Jian Lin, Xiuding Yang, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Micromachines|July 29, 2023
ATNet: A Defect Detection Framework for X-ray Images of DIP Chip Lead BondingRenbin Huang, Daohua Zhan, Xiuding Yang, et al.
Materials (Basel, Switzerland)|July 27, 2022
Surface Quality Control Strategy of Aspherical Mold Based on Screw Feed Polishing of Small Polishing ToolJiarong Zhang, Han Wang, Xiangyou Zhu, et al.
Micromachines|September 28, 2023
Convolutional Neural Network Defect Detection Algorithm for Wire Bonding X-ray ImagesDaohua Zhan, Renbin Huang, Kunran Yi, et al.
Micromachines|August 26, 2023
A High-Precision Multi-Beam Optical Measurement Method for Cylindrical Surface ProfileYinghong Zhou, Zhiliang Wu, Nian Cai, et al.
Materials (Basel, Switzerland)|April 13, 2023
Strip Surface Defect Detection Algorithm Based on YOLOv5Han Wang, Xiuding Yang, Bei Zhou, et al.
Micromachines|June 28, 2023
A Lightweight Method for Detecting IC Wire Bonding Defects in X-ray ImagesDaohua Zhan, Jian Lin, Xiuding Yang, et al.
Pageof 1