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David G Castner

Surface and interface analysis : SIA

Showing results (1-10 of 7) with videos related to

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Surface and Interface Analysis : SIA|November 3, 2018
Surface Analysis: From Single Crystals to BiomaterialsDavid G Castner
Surface and Interface Analysis : SIA|November 16, 2020
Polymer Surface Analysis: The Leadership and Contributions of David BriggsDavid G Castner, Buddy D Ratner
Surface and Interface Analysis : SIA|December 3, 2013
Low energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticlesAli Rafati, Rik Ter Veen, David G Castner
Surface and Interface Analysis : SIA|April 26, 2011
Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samplesManish Dubey, J Brison, David W Grainger, et al.
Surface and Interface Analysis : SIA|April 19, 2016
A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS DataDavid J H Cant, Yung-Chen Wang, David G Castner, et al.
Surface and Interface Analysis : SIA|November 8, 2011
ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridineJeremy Brison, Danielle S W Benoit, Shin Muramoto, et al.
Surface and Interface Analysis : SIA|September 17, 2009
Surface Analysis of Photolithographic Patterns using ToF-SIMS and PCAManish Dubey, Kazunori Emoto, Fang Cheng, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Surface and Interface Analysis : SIA|November 3, 2018
Surface Analysis: From Single Crystals to BiomaterialsDavid G Castner
Surface and Interface Analysis : SIA|November 16, 2020
Polymer Surface Analysis: The Leadership and Contributions of David BriggsDavid G Castner, Buddy D Ratner
Surface and Interface Analysis : SIA|December 3, 2013
Low energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticlesAli Rafati, Rik Ter Veen, David G Castner
Surface and Interface Analysis : SIA|April 26, 2011
Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samplesManish Dubey, J Brison, David W Grainger, et al.
Surface and Interface Analysis : SIA|April 19, 2016
A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS DataDavid J H Cant, Yung-Chen Wang, David G Castner, et al.
Surface and Interface Analysis : SIA|November 8, 2011
ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridineJeremy Brison, Danielle S W Benoit, Shin Muramoto, et al.
Surface and Interface Analysis : SIA|September 17, 2009
Surface Analysis of Photolithographic Patterns using ToF-SIMS and PCAManish Dubey, Kazunori Emoto, Fang Cheng, et al.
Pageof 1