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David G Castner

Showing results (11-20 of 142) with videos related to

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Surface and Interface Analysis : SIA|November 16, 2020
Polymer Surface Analysis: The Leadership and Contributions of David BriggsDavid G Castner, Buddy D Ratner
Langmuir : the ACS Journal of Surfaces and Colloids|May 24, 2019
Vibrational Sum-Frequency Scattering as a Sensitive Approach to Detect Structural Changes in Collagen Fibers Treated with SurfactantsPatrik K Johansson, David G Castner
Mass Spectrometry (Tokyo, Japan)|December 19, 2013
Image and Spectral Processing for ToF-SIMS Analysis of Biological MaterialsDaniel J Graham, David G Castner
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|April 13, 2010
ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam AnalysisJ Brison, S Muramoto, David G Castner
Analytical Chemistry|November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic filmsShin Muramoto, Jeremy Brison, David G Castner
Biointerphases|October 5, 2014
Grafting titanium nitride surfaces with sodium styrene sulfonate thin filmsGilad Zorn, Véronique Migonney, David G Castner
Surface and Interface Analysis : SIA|December 3, 2013
Low energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticlesAli Rafati, Rik Ter Veen, David G Castner
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|February 8, 2024
ToF-SIMS analysis of ultrathin films and their fragmentation patternsShin Muramoto, Daniel J Graham, David G Castner
Analytical Chemistry|February 28, 2008
XPS, TOF-SIMS, NEXAFS, and SPR characterization of nitrilotriacetic acid-terminated self-assembled monolayers for controllable immobilization of proteinsFang Cheng, Lara J Gamble, David G Castner
Topics in Catalysis|June 30, 2018
Nonlinear Optical Methods for Characterization of Molecular Structure and Surface ChemistryPatrik K Johansson, Lars Schmüser, David G Castner
Pageof 15

Showing results (11-20 of 142) with videos related to

Sort By:
Pageof 15
Surface and Interface Analysis : SIA|November 16, 2020
Polymer Surface Analysis: The Leadership and Contributions of David BriggsDavid G Castner, Buddy D Ratner
Langmuir : the ACS Journal of Surfaces and Colloids|May 24, 2019
Vibrational Sum-Frequency Scattering as a Sensitive Approach to Detect Structural Changes in Collagen Fibers Treated with SurfactantsPatrik K Johansson, David G Castner
Mass Spectrometry (Tokyo, Japan)|December 19, 2013
Image and Spectral Processing for ToF-SIMS Analysis of Biological MaterialsDaniel J Graham, David G Castner
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|April 13, 2010
ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam AnalysisJ Brison, S Muramoto, David G Castner
Analytical Chemistry|November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic filmsShin Muramoto, Jeremy Brison, David G Castner
Biointerphases|October 5, 2014
Grafting titanium nitride surfaces with sodium styrene sulfonate thin filmsGilad Zorn, Véronique Migonney, David G Castner
Surface and Interface Analysis : SIA|December 3, 2013
Low energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticlesAli Rafati, Rik Ter Veen, David G Castner
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|February 8, 2024
ToF-SIMS analysis of ultrathin films and their fragmentation patternsShin Muramoto, Daniel J Graham, David G Castner
Analytical Chemistry|February 28, 2008
XPS, TOF-SIMS, NEXAFS, and SPR characterization of nitrilotriacetic acid-terminated self-assembled monolayers for controllable immobilization of proteinsFang Cheng, Lara J Gamble, David G Castner
Topics in Catalysis|June 30, 2018
Nonlinear Optical Methods for Characterization of Molecular Structure and Surface ChemistryPatrik K Johansson, Lars Schmüser, David G Castner
Pageof 15