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David J Dingley

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Ultramicroscopy|December 6, 2005
High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivityAngus J Wilkinson, Graham Meaden, David J Dingley
Journal of Electron Microscopy|July 17, 2010
Elastic strain tensor measurement using electron backscatter diffraction in the SEMDavid J Dingley, Angus J Wilkinson, Graham Meaden, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Ultramicroscopy|December 6, 2005
High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivityAngus J Wilkinson, Graham Meaden, David J Dingley
Journal of Electron Microscopy|July 17, 2010
Elastic strain tensor measurement using electron backscatter diffraction in the SEMDavid J Dingley, Angus J Wilkinson, Graham Meaden, et al.
Pageof 1