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The Review of Scientific Instruments
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November 3, 2016
X-ray reflectometer for single layer and multilayer coating characterization at 8 keV: An interlaboratory study
Danielle N Gurgew, David M Broadway, Mikhail Gubarev, et al.
Journal of Astronomical Telescopes, Instruments, and Systems
|
September 9, 2020
Full-shell x-ray optics development at NASA Marshall Space Flight Center
Kiranmayee Kilaru, Brian D Ramsey, Wayne H Baumgartner, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
The Review of Scientific Instruments
|
November 3, 2016
X-ray reflectometer for single layer and multilayer coating characterization at 8 keV: An interlaboratory study
Danielle N Gurgew, David M Broadway, Mikhail Gubarev, et al.
Journal of Astronomical Telescopes, Instruments, and Systems
|
September 9, 2020
Full-shell x-ray optics development at NASA Marshall Space Flight Center
Kiranmayee Kilaru, Brian D Ramsey, Wayne H Baumgartner, et al.
Page
of 1