Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

David P Field

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|December 3, 2014
3D image reconstruction of fiber systems using electron tomographyOsama M Fakron, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2016
Phase Identification of Dual-Phase (DP980) Steels by Electron Backscatter Diffraction and Nanoindentation TechniquesFan Zhang, Annie Ruimi, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2011
A review of strain analysis using electron backscatter diffractionStuart I Wright, Matthew M Nowell, David P Field
Materials & Design|April 4, 2022
Additive manufacturing of Ti-Ni bimetallic structuresAli Afrouzian, Cory J Groden, David P Field, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 3, 2014
3D image reconstruction of fiber systems using electron tomographyOsama M Fakron, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2016
Phase Identification of Dual-Phase (DP980) Steels by Electron Backscatter Diffraction and Nanoindentation TechniquesFan Zhang, Annie Ruimi, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2011
A review of strain analysis using electron backscatter diffractionStuart I Wright, Matthew M Nowell, David P Field
Materials & Design|April 4, 2022
Additive manufacturing of Ti-Ni bimetallic structuresAli Afrouzian, Cory J Groden, David P Field, et al.
Pageof 1