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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 14, 2024
Model-Fitting Weighted Least Squares as an Alternative to Principal Component Analysis for Analyzing Energy-Dispersive X-ray Spectroscopy Spectrum ImagesDavid Wahlqvist, Martin EkNanotechnology|June 6, 2022
Compositional analysis of oxide-embedded III-V nanostructuresMartin Ek, C Leon M Petersson, Jesper Wallentin, et al.Materials (Basel, Switzerland)|February 11, 2023
Mo3Ni2N Nanoparticle Generation by Spark DischargeJonas Elmroth Nordlander, Marie Bermeo, Pau Ternero, et al.Accounts of Chemical Research|November 30, 2017
Atomic-Scale Choreography of Vapor-Liquid-Solid Nanowire GrowthMartin Ek, Michael A FillerACS Nano|March 8, 2013
Diameter limitation in growth of III-Sb-containing nanowire heterostructuresMartin Ek, B Mattias Borg, Jonas Johansson, et al.Journal of Microscopy|March 31, 2021
Characterisation of worn WC tool using STEM-EDS aided by principal component analysisIsac Lazar, Rebecka Lindvall, Filip Lenrick, et al.ACS Nano|June 12, 2012
Combinatorial approaches to understanding polytypism in III-V nanowiresJonas Johansson, Jessica Bolinsson, Martin Ek, et al.Nanoscale Advances|September 22, 2022
Continuous gas-phase synthesis of core-shell nanoparticles via surface segregationMarkus Snellman, Namsoon Eom, Martin Ek, et al.Nano Letters|December 14, 2011
Electron trapping in InP nanowire FETs with stacking faultsJesper Wallentin, Martin Ek, L Reine Wallenberg, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2013
FIB plan and side view cross-sectional TEM sample preparation of nanostructuresFilip Lenrick, Martin Ek, Daniel Jacobsson, et al.Pageof 3