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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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Dennis Lin

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ACS Applied Materials & Interfaces|October 28, 2024

Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETsLuca Panarella, Stanislav Tyaginov, Ben Kaczer, et al.

ACS Nano|May 27, 2021

Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance NanoelectronicsYuanyuan Shi, Benjamin Groven, Jill Serron, et al.

Nanotechnology|August 3, 2018

Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformityDaniele Chiappe, Jonathan Ludwig, Alessandra Leonhardt, et al.

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Search research articles

Showing results (11-20 of 13) with videos related to

Sort By:

Pageof 2

You have reached the last page of results.This site can display upto 13 results.

ACS Applied Materials & Interfaces|October 28, 2024

Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETsLuca Panarella, Stanislav Tyaginov, Ben Kaczer, et al.

ACS Nano|May 27, 2021

Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance NanoelectronicsYuanyuan Shi, Benjamin Groven, Jill Serron, et al.

Nanotechnology|August 3, 2018

Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformityDaniele Chiappe, Jonathan Ludwig, Alessandra Leonhardt, et al.

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