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Derek H Warner

Showing results (1-10 of 6) with videos related to

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Physical Review Letters|October 15, 2021
Dissolution at a Ductile Crack TipWenjia Gu, Derek H Warner
3D Printing and Additive Manufacturing|January 19, 2023
Assessment of Additive Manufacturing for Increasing Sustainability and Productivity of Smallholder AgricultureWenjia Gu, Erika Styger, Derek H Warner
Nature Communications|February 11, 2022
Atomic mechanism of near threshold fatigue crack growth in vacuumMingjie Zhao, Wenjia Gu, Derek H Warner
Proceedings of the National Academy of Sciences of the United States of America|July 12, 2017
On the debris-level origins of adhesive wearRamin Aghababaei, Derek H Warner, Jean-François Molinari
Nature Communications|June 7, 2016
Critical length scale controls adhesive wear mechanismsRamin Aghababaei, Derek H Warner, Jean-Francois Molinari
Materials (Basel, Switzerland)|March 25, 2022
Hot Isostatic Pressing for Fatigue Critical Additively Manufactured Ti-6Al-4VTerrence P Moran, Patricio E Carrion, Seungjong Lee, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Physical Review Letters|October 15, 2021
Dissolution at a Ductile Crack TipWenjia Gu, Derek H Warner
3D Printing and Additive Manufacturing|January 19, 2023
Assessment of Additive Manufacturing for Increasing Sustainability and Productivity of Smallholder AgricultureWenjia Gu, Erika Styger, Derek H Warner
Nature Communications|February 11, 2022
Atomic mechanism of near threshold fatigue crack growth in vacuumMingjie Zhao, Wenjia Gu, Derek H Warner
Proceedings of the National Academy of Sciences of the United States of America|July 12, 2017
On the debris-level origins of adhesive wearRamin Aghababaei, Derek H Warner, Jean-François Molinari
Nature Communications|June 7, 2016
Critical length scale controls adhesive wear mechanismsRamin Aghababaei, Derek H Warner, Jean-Francois Molinari
Materials (Basel, Switzerland)|March 25, 2022
Hot Isostatic Pressing for Fatigue Critical Additively Manufactured Ti-6Al-4VTerrence P Moran, Patricio E Carrion, Seungjong Lee, et al.
Pageof 1