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Physical Review Letters|May 14, 2021
Measuring Density Functional Parameters from Electron Diffraction PatternsDing Peng, Philip N H NakashimaActa Crystallographica. Section A, Foundations and Advances|May 2, 2019
Identification of the impurity phase in high-purity CeB6 by convergent-beam electron diffractionDing Peng, Philip N H NakashimaOptics Letters|March 27, 2012
In situ quantification of noise as a function of signal in digital imagesPhilip N H NakashimaPhysical Review Letters|October 13, 2007
Thickness difference: a new filtering tool for quantitative electron diffractionPhilip N H NakashimaIucrj|November 17, 2018
Three-beam convergent-beam electron diffraction for measuring crystallographic phasesYueming Guo, Philip N H Nakashima, Joanne EtheridgeJournal of Applied Crystallography|April 10, 2024
Observations of specimen morphology effects on near-zone-axis convergent-beam electron diffraction patternsXiaofen Tan, Laure Bourgeois, Philip N H NakashimaActa Crystallographica. Section A, Foundations of Crystallography|August 19, 2007
Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne EtheridgeUltramicroscopy|November 26, 2009
Optimization of exit-plane waves restored from HRTEM through-focal seriesRolf Erni, Marta D Rossell, Philip N H NakashimaUltramicroscopy|June 14, 2011
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne EtheridgeProceedings of the National Academy of Sciences of the United States of America|August 14, 2013
Direct atomic structure determination by the inspection of structural phasePhilip N H Nakashima, Alexander F Moodie, Joanne EtheridgePageof 19