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Optics Express
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March 4, 2020
Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity
Refahi Abou Khachfe, Dominique Ausserre
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of 1
Search research articles
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Showing results (1-10 of 1) with videos related to
Sort By:
Page
of 1
Optics Express
|
March 4, 2020
Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity
Refahi Abou Khachfe, Dominique Ausserre
Page
of 1