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Microscopy Research and Technique|December 25, 2010
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austeniteEugenia Zelaya, Dominique SchryversMicron (Oxford, England : 1993)|September 27, 2005
Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloyZhiqing Yang, Dominique SchryversNature Materials|June 23, 2009
Linking a completely three-dimensional nanostrain to a structural transformation eigenstrainWim Tirry, Dominique SchryversMicroscopy Research and Technique|September 11, 2020
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwiresSaeid Pourbabak, Andrey Orekhov, Dominique SchryversMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 27, 2014
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEMEva Grieten, Joost Caen, Dominique SchryversActa Crystallographica. Section B, Structural Science|November 17, 2006
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48Wim Tirry, Dominique Schryvers, Kevin Jorissen, et al.Micron (Oxford, England : 1993)|January 12, 2017
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approachVahid Samaeeaghmiyoni, Hosni Idrissi, Jonas Groten, et al.Science Advances|March 22, 2016
Low-temperature plasticity of olivine revisited with in situ TEM nanomechanical testingHosni Idrissi, Caroline Bollinger, Francesca Boioli, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 21, 2007
High-quality sample preparation by low kV FIB thinning for analytical TEM measurementsSara Bals, Wim Tirry, Remco Geurts, et al.Acta Biomaterialia|September 21, 2010
Stability of Ni in nitinol oxide surfacesHe Tian, Dominique Schryvers, Di Liu, et al.Pageof 3