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Micron (Oxford, England : 1993)|January 7, 2011
Understanding the micro structure of Berea Sandstone by the simultaneous use of micro-computed tomography (micro-CT) and focused ion beam-scanning electron microscopy (FIB-SEM)Bijoyendra Bera, Sushanta K Mitra, Douglas Vick
Optics Express|March 17, 2019
Fast electrons interacting with a natural hyperbolic medium: bismuth telluridePrashant Shekhar, Sarang Pendharker, Douglas Vick, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 5, 2012
Characterization of nanometer-scale porosity in reservoir carbonate rock by focused ion beam-scanning electron microscopyBijoyendra Bera, Naga Siva Kumar Gunda, Sushanta K Mitra, et al.
Ultramicroscopy|June 29, 2015
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constantHatem Labidi, Martin Kupsta, Taleana Huff, et al.
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