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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 16, 2021
Focused Ion Beam Sample Preparation for In Situ Thermal and Electrical Transmission Electron MicroscopyDražen Radić, Martin Peterlechner, Hartmut Bracht
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 1, 2022
Treating Knock-On Displacements in Fluctuation Electron Microscopy ExperimentsDražen Radić, Martin Peterlechner, Matthias Posselt, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Fluctuation Electron Microscopy on Amorphous Silicon and Amorphous GermaniumDražen Radić, Martin Peterlechner, Matthias Posselt, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 26, 2023
Challenges of Electron Correlation Microscopy on Amorphous Silicon and Amorphous GermaniumDražen Radić, Martin Peterlechner, Katharina Spangenberg, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2020
Comparison of Experimental STEM Conditions for Fluctuation Electron MicroscopyDražen Radić, Sven Hilke, Martin Peterlechner, et al.
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