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The Review of Scientific Instruments|January 3, 2020
Apparatus for electrically detected electron nuclear double resonance in solid state electronic devicesBrian R Manning, Ryan J Waskiewicz, Duane J McCrory, et al.IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.Pageof 1