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Journal of Microscopy|December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structuresE A Marquis, B P Geiser, T J Prosa, et al.
Journal of Microscopy|December 16, 2010
Improvements in planar feature reconstructions in atom probe tomographyD J Larson, B P Geiser, T J Prosa, et al.
Ultramicroscopy|December 15, 2010
Advances in the reconstruction of atom probe tomography dataB Gault, D Haley, F de Geuser, et al.
Ultramicroscopy|March 10, 2015
Encapsulation method for atom probe tomography analysis of nanoparticlesD J Larson, A D Giddings, Y Wu, et al.
Ultramicroscopy|January 8, 2013
Analysis of implanted silicon dopant profilesT J Prosa, D Olson, B Geiser, et al.
Nature Communications|May 27, 2017
Atomic-scale age resolution of planetary eventsL F White, J R Darling, D E Moser, et al.
Journal of Microscopy|January 26, 2010
Atom probe tomography analysis of poly(3-alkylthiophene)sT J Prosa, S Kostrna Keeney, T F Kelly
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