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E A Schweikert

Showing results (1-10 of 18) with videos related to

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Talanta|January 1, 1975
Short communicationsD L Swindle, E A Schweikert
Analytical Chemistry|March 1, 1974
Determination of lead using charged particle activation analysisD C Riddle, E A Schweikert
Nano Letters|March 4, 2008
Examination of nanoparticles via single large cluster impactsS Rajagopalachary, S V Verkhoturov, E A Schweikert
Physical Review Letters|March 6, 2004
Simultaneous ejection of two molecular ions from keV gold atomic and polyatomic projectile impactsR D Rickman, S V Verkhoturov, E S Parilis, et al.
The Review of Scientific Instruments|November 5, 2013
SIMS instrumentation and methodology for mapping of co-localized moleculesM J Eller, S V Verkhoturov, S Della-Negra, et al.
Surface and Interface Analysis : SIA|May 24, 2011
Photon emission from massive projectile impacts on solidsF A Fernandez-Lima, V T Pinnick, S Della-Negra, et al.
Rapid Communications in Mass Spectrometry : RCM|March 10, 2001
Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfacesR D English, M J Van Stipdonk, C W Diehnelt, et al.
Analytical Chemistry|June 14, 2011
Calcium Phosphate Phase Identification Using XPS and Time-of-Flight Cluster SIMSC C Chusuei, D W Goodman, M J Van Stipdonk, et al.
Analytical Chemistry|January 5, 2001
Characterization of photooxidized self-assembled monolayers and bilayers by spontaneous desorption mass spectrometryR D English, M J Van Stipdonk, R C Sabapathy, et al.
Surface and Interface Analysis : SIA|October 29, 2013
Characteristics of positive and negative secondary ions emitted from [Formula: see text] and [Formula: see text] impactsJ D DeBord, F A Fernandez-Lima, S V Verkhoturov, et al.
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
Talanta|January 1, 1975
Short communicationsD L Swindle, E A Schweikert
Analytical Chemistry|March 1, 1974
Determination of lead using charged particle activation analysisD C Riddle, E A Schweikert
Nano Letters|March 4, 2008
Examination of nanoparticles via single large cluster impactsS Rajagopalachary, S V Verkhoturov, E A Schweikert
Physical Review Letters|March 6, 2004
Simultaneous ejection of two molecular ions from keV gold atomic and polyatomic projectile impactsR D Rickman, S V Verkhoturov, E S Parilis, et al.
The Review of Scientific Instruments|November 5, 2013
SIMS instrumentation and methodology for mapping of co-localized moleculesM J Eller, S V Verkhoturov, S Della-Negra, et al.
Surface and Interface Analysis : SIA|May 24, 2011
Photon emission from massive projectile impacts on solidsF A Fernandez-Lima, V T Pinnick, S Della-Negra, et al.
Rapid Communications in Mass Spectrometry : RCM|March 10, 2001
Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfacesR D English, M J Van Stipdonk, C W Diehnelt, et al.
Analytical Chemistry|June 14, 2011
Calcium Phosphate Phase Identification Using XPS and Time-of-Flight Cluster SIMSC C Chusuei, D W Goodman, M J Van Stipdonk, et al.
Analytical Chemistry|January 5, 2001
Characterization of photooxidized self-assembled monolayers and bilayers by spontaneous desorption mass spectrometryR D English, M J Van Stipdonk, R C Sabapathy, et al.
Surface and Interface Analysis : SIA|October 29, 2013
Characteristics of positive and negative secondary ions emitted from [Formula: see text] and [Formula: see text] impactsJ D DeBord, F A Fernandez-Lima, S V Verkhoturov, et al.
Pageof 2