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E Cadel

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Ultramicroscopy|April 3, 2009
Atomic-scale redistribution of Pt during reactive diffusion in Ni (5% Pt)-Si contactsO Cojocaru-Mirédin, E Cadel, D Blavette, et al.
Ultramicroscopy|January 2, 2009
Identification of phases in gas-atomised droplets by combination of neutron and X-ray diffraction techniques with atom probe tomographyM Calvo-Dahlborg, S Chambreland, C M Bao, et al.
Ultramicroscopy|November 6, 2013
3D analysis of advanced nano-devices using electron and atom probe tomographyA Grenier, S Duguay, J P Barnes, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Ultramicroscopy|April 3, 2009
Atomic-scale redistribution of Pt during reactive diffusion in Ni (5% Pt)-Si contactsO Cojocaru-Mirédin, E Cadel, D Blavette, et al.
Ultramicroscopy|January 2, 2009
Identification of phases in gas-atomised droplets by combination of neutron and X-ray diffraction techniques with atom probe tomographyM Calvo-Dahlborg, S Chambreland, C M Bao, et al.
Ultramicroscopy|November 6, 2013
3D analysis of advanced nano-devices using electron and atom probe tomographyA Grenier, S Duguay, J P Barnes, et al.
Pageof 1