Search research articles
Contact Us
Filters
Showing results (1-10 of 20) with videos related to
Page
of 2
Sort By:
Applied Optics
|
February 4, 2010
Application of a synthetic aperture optical system to infrared imaging
E L Dereniak
Applied Optics
|
August 21, 2010
Error-free image compression algorithm using classifying-sequencing techniques
J D He, E L Dereniak
Applied Optics
|
January 23, 2010
A comparison of the theoretical operation of high-impedance and low-impedance detectors
E L Dereniak, W L Wolfe
Applied Optics
|
June 18, 2010
Extrinsic silicon photodetector characterization
J P Garcia, E L Dereniak
Applied Optics
|
June 23, 2010
Extrinsic silicon photodetector characterization: errata
J P Garcia, E L Dereniak
Applied Optics
|
March 6, 2008
Mixed-expectation image-reconstruction technique
J P Garcia, E L Dereniak
Applied Optics
|
August 12, 2010
Measurement of the index of refraction of the plastic Phenoxy PKFE
K Kuhler, E L Dereniak, M Buchanan
Applied Optics
|
March 25, 2010
Bidirectional reflectance distribution function of gold-plated sandpaper
T W Stuhlinger, E L Dereniak, F O Bartell
Applied Optics
|
March 12, 2010
Infrared propagation and performance modeling at the Electro-Optical Test Facility
D G Crowe, D K Cohen, E L Dereniak
Applied Optics
|
April 20, 2010
Bidirectional transmittance distribution function measurements on ZnSe
E L Dereniak, L G Brod, J E Hubbs
Page
of 2
Search research articles
Search
Showing results (1-10 of 20) with videos related to
Sort By:
Page
of 2
Applied Optics
|
February 4, 2010
Application of a synthetic aperture optical system to infrared imaging
E L Dereniak
Applied Optics
|
August 21, 2010
Error-free image compression algorithm using classifying-sequencing techniques
J D He, E L Dereniak
Applied Optics
|
January 23, 2010
A comparison of the theoretical operation of high-impedance and low-impedance detectors
E L Dereniak, W L Wolfe
Applied Optics
|
June 18, 2010
Extrinsic silicon photodetector characterization
J P Garcia, E L Dereniak
Applied Optics
|
June 23, 2010
Extrinsic silicon photodetector characterization: errata
J P Garcia, E L Dereniak
Applied Optics
|
March 6, 2008
Mixed-expectation image-reconstruction technique
J P Garcia, E L Dereniak
Applied Optics
|
August 12, 2010
Measurement of the index of refraction of the plastic Phenoxy PKFE
K Kuhler, E L Dereniak, M Buchanan
Applied Optics
|
March 25, 2010
Bidirectional reflectance distribution function of gold-plated sandpaper
T W Stuhlinger, E L Dereniak, F O Bartell
Applied Optics
|
March 12, 2010
Infrared propagation and performance modeling at the Electro-Optical Test Facility
D G Crowe, D K Cohen, E L Dereniak
Applied Optics
|
April 20, 2010
Bidirectional transmittance distribution function measurements on ZnSe
E L Dereniak, L G Brod, J E Hubbs
Page
of 2