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E M Gullikson

Showing results (1-10 of 31) with videos related to

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Applied Optics|August 1, 1997
Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet-soft-x-ray regionR Soufli, E M Gullikson
Applied Optics|February 15, 2008
Absolute Photoabsorption Measurements of Molybdenum in the Range 60-930 eV for Optical Constant DeterminationR Soufli, E M Gullikson
Applied Optics|November 6, 2010
Large-area avalanche photodiodes for the detection of soft x raysE M Gullikson, E Gramsch, M Szawlowski
Optics Letters|December 1, 2007
Efficient high-order diffraction of extreme-ultraviolet light and soft x-rays by nanostructured volume gratingsD Hambach, G Schneider, E M Gullikson
Applied Optics|September 22, 2010
Tarnishing of Mo/Si multilayer x-ray mirrorsJ H Underwood, E M Gullikson, K Nguyen
Applied Optics|September 22, 2010
Masked deposition techniques for achieving multilayer period variations required for short-wavelength (68-A) soft-x-ray imaging opticsJ B Kortright, E M Gullikson, P E Denham
Optics Express|December 10, 2009
Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet lightA Aquila, F Salmassi, Yanwei Liu, et al.
Optics Express|August 23, 2018
Ultra-low blaze angle gratings for synchrotron and free electron laser applicationsD L Voronov, E M Gullikson, H A Padmore
Optics Express|October 19, 2017
Large area nanoimprint enables ultra-precise x-ray diffraction gratingsD L Voronov, E M Gullikson, H A Padmore
Applied Optics|March 18, 2008
At-wavelength, system-level flare characterization of extreme-ultraviolet optical systemsP Naulleau, K A Goldberg, E M Gullikson, et al.
Pageof 4

Showing results (1-10 of 31) with videos related to

Sort By:
Pageof 4
Applied Optics|August 1, 1997
Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet-soft-x-ray regionR Soufli, E M Gullikson
Applied Optics|February 15, 2008
Absolute Photoabsorption Measurements of Molybdenum in the Range 60-930 eV for Optical Constant DeterminationR Soufli, E M Gullikson
Applied Optics|November 6, 2010
Large-area avalanche photodiodes for the detection of soft x raysE M Gullikson, E Gramsch, M Szawlowski
Optics Letters|December 1, 2007
Efficient high-order diffraction of extreme-ultraviolet light and soft x-rays by nanostructured volume gratingsD Hambach, G Schneider, E M Gullikson
Applied Optics|September 22, 2010
Tarnishing of Mo/Si multilayer x-ray mirrorsJ H Underwood, E M Gullikson, K Nguyen
Applied Optics|September 22, 2010
Masked deposition techniques for achieving multilayer period variations required for short-wavelength (68-A) soft-x-ray imaging opticsJ B Kortright, E M Gullikson, P E Denham
Optics Express|December 10, 2009
Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet lightA Aquila, F Salmassi, Yanwei Liu, et al.
Optics Express|August 23, 2018
Ultra-low blaze angle gratings for synchrotron and free electron laser applicationsD L Voronov, E M Gullikson, H A Padmore
Optics Express|October 19, 2017
Large area nanoimprint enables ultra-precise x-ray diffraction gratingsD L Voronov, E M Gullikson, H A Padmore
Applied Optics|March 18, 2008
At-wavelength, system-level flare characterization of extreme-ultraviolet optical systemsP Naulleau, K A Goldberg, E M Gullikson, et al.
Pageof 4