Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

E W van der Ham

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Applied Optics|March 18, 2008
Sampling period criterion in a scanning-beam techniqueC A Schrama, E W van der Ham
Optics Letters|November 3, 2009
Self-dispersive sum-frequency generation at interfacesE W van der Ham, Q H Vrehen, E R Eliel
Optics Letters|December 19, 2007
Transmission reflection anomaly in second-harmonic generation from a monolayerS A van den Berg, E W van der Ham, Q H Vrehen, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Optics|March 18, 2008
Sampling period criterion in a scanning-beam techniqueC A Schrama, E W van der Ham
Optics Letters|November 3, 2009
Self-dispersive sum-frequency generation at interfacesE W van der Ham, Q H Vrehen, E R Eliel
Optics Letters|December 19, 2007
Transmission reflection anomaly in second-harmonic generation from a monolayerS A van den Berg, E W van der Ham, Q H Vrehen, et al.
Pageof 1