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Edgar F Rauch

Showing results (1-10 of 9) with videos related to

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Ultramicroscopy|February 12, 2016
Highlighting material structure with transmission electron diffraction correlation coefficient mapsÁkos K Kiss, Edgar F Rauch, János L Lábár
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 25, 2015
A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM TechniquesÁkos K Kiss, Edgar F Rauch, Béla Pécz, et al.
Ultramicroscopy|July 12, 2024
Elastic strain mapping of plastically deformed materials by TEMArthur Després, Salomé Parent, Muriel Véron, et al.
Ultramicroscopy|May 14, 2022
Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mappingPatrick Harrison, Xuyang Zhou, Saurabh Mohan Das, et al.
Nanotechnology|October 1, 2016
Identifying and mapping the polytypes and orientation relationships in ZnO/CdSe core-shell nanowire arraysVincent Consonni, Laetitia Rapenne, Gilles Renou, et al.
Small Methods|February 28, 2025
Correlating Grain Boundary Character and Composition in 3-Dimensions Using 4D-Scanning Precession Electron Diffraction and Atom Probe TomographySaurabh M Das, Patrick Harrison, Srikakulapu Kiranbabu, et al.
Scientific Reports|May 29, 2024
Improved ACOM pattern matching in 4D-STEM through adaptive sub-pixel peak detection and image reconstructionNicolas Folastre, Junhao Cao, Gozde Oney, et al.
Scanning|July 3, 2019
Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural PaintingsStavros Nicolopoulos, Partha P Das, Alejandro Gómez Pérez, et al.
Ultramicroscopy|September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomographyPatrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|February 12, 2016
Highlighting material structure with transmission electron diffraction correlation coefficient mapsÁkos K Kiss, Edgar F Rauch, János L Lábár
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 25, 2015
A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM TechniquesÁkos K Kiss, Edgar F Rauch, Béla Pécz, et al.
Ultramicroscopy|July 12, 2024
Elastic strain mapping of plastically deformed materials by TEMArthur Després, Salomé Parent, Muriel Véron, et al.
Ultramicroscopy|May 14, 2022
Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mappingPatrick Harrison, Xuyang Zhou, Saurabh Mohan Das, et al.
Nanotechnology|October 1, 2016
Identifying and mapping the polytypes and orientation relationships in ZnO/CdSe core-shell nanowire arraysVincent Consonni, Laetitia Rapenne, Gilles Renou, et al.
Small Methods|February 28, 2025
Correlating Grain Boundary Character and Composition in 3-Dimensions Using 4D-Scanning Precession Electron Diffraction and Atom Probe TomographySaurabh M Das, Patrick Harrison, Srikakulapu Kiranbabu, et al.
Scientific Reports|May 29, 2024
Improved ACOM pattern matching in 4D-STEM through adaptive sub-pixel peak detection and image reconstructionNicolas Folastre, Junhao Cao, Gozde Oney, et al.
Scanning|July 3, 2019
Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural PaintingsStavros Nicolopoulos, Partha P Das, Alejandro Gómez Pérez, et al.
Ultramicroscopy|September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomographyPatrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Pageof 1