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Edward Oltman

Showing results (1-10 of 4) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 28, 2021
Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard SpecimensTy J Prosa, Edward Oltman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 25, 2021
Using Mass Resolving Power as a Performance Metric in the Atom ProbeFred Meisenkothen, Thomas F Kelly, Edward Oltman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
First data from a commercial local electrode atom probe (LEAP)Thomas F Kelly, Tye T Gribb, Jesse D Olson, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 28, 2021
Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard SpecimensTy J Prosa, Edward Oltman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 25, 2021
Using Mass Resolving Power as a Performance Metric in the Atom ProbeFred Meisenkothen, Thomas F Kelly, Edward Oltman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
First data from a commercial local electrode atom probe (LEAP)Thomas F Kelly, Tye T Gribb, Jesse D Olson, et al.
Pageof 1