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First data from a commercial local electrode atom probe (LEAP).

Thomas F Kelly1, Tye T Gribb, Jesse D Olson

  • 1Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA. tkelly@imago.com

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 6, 2004
PubMed
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The new Local Electrode Atom Probe (LEAP) offers significantly faster analysis and a larger field of view compared to traditional 3D atom probes. This advanced materials analysis tool enables rapid collection of large datasets for detailed microstructural investigation.

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Conventional three-dimensional atom probes (3DAP) have limitations in speed and field of view for materials analysis.
  • The development of advanced atom probe techniques is crucial for detailed microstructural characterization.

Purpose of the Study:

  • To introduce and evaluate the performance of the first commercial prototype of the Local Electrode Atom Probe (LEAP).
  • To demonstrate the advantages of LEAP technology over conventional 3DAP for materials analysis.

Main Methods:

  • Commercial prototype testing of the Imago LEAP instrument.
  • Performance parameter evaluation including data collection rate and field of view.
  • Comparative analysis against conventional 3DAP designs.

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Main Results:

  • The Imago LEAP achieves a sustained data collection rate of 1 million atoms/minute, approximately 600 times faster than previous technologies.
  • Large-scale image acquisition, previously taking days, can now be completed in under an hour.
  • The LEAP offers a field of view 40 times larger than conventional 3DAP, enabling analysis of larger volumes (100 nm diameter by 100 nm deep) containing millions of atoms.

Conclusions:

  • The Local Electrode Atom Probe (LEAP) represents a significant advancement in atom probe tomography, offering unprecedented speed and analytical volume.
  • LEAP technology enhances materials analysis capabilities, facilitating detailed investigation of microstructures.
  • Commercial availability of LEAP promises broader application in scientific research and materials development.