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Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2024
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Al<sub>2</sub>O<sub>3</sub> Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2022
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Using Mass Resolving Power as a Performance Metric in the Atom Probe.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2021
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Compositional boundary layers trigger liquid unmixing in a basaltic crystal mush.

Nature communications·2019
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Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography data.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2011
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First data from a commercial local electrode atom probe (LEAP).

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2004
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Updated: Oct 26, 2025

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Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard Specimens.

Ty J Prosa1, Edward Oltman1

  • 1CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI53711, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 28, 2021
PubMed
Summary

Atom probe tomography (APT) data processing requires advanced methods for accurate analysis. This study refines mass spectrum analysis, deadtime corrections, and error propagation for reliable, high-precision isotopic measurements.

Keywords:
atom probe tomographydeadtimepile-upprecisiontime-of-flight mass spectrometry

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Atom probe tomography (APT) has grown in adoption and dataset size over 15 years.
  • Current data processing sophistication lags behind the increasing scale and precision demands of APT.
  • Small datasets previously allowed for secondary consideration of deadtime and background corrections.

Purpose of the Study:

  • To address the need for high-precision data processing in large-scale APT datasets.
  • To evaluate and refine methods for mass spectrum ranging, deadtime corrections, and error propagation.
  • To achieve reliable accuracy at the parts-per-million level for isotopic fraction measurements.

Main Methods:

  • Application of refined mass spectrum ranging techniques.
  • Implementation of precise deadtime corrections.
  • Systematic error propagation analysis.
  • Utilizing an extrinsic-silicon standard specimen for validation.

Main Results:

  • Achieved precision consistent with theoretical counting statistics.
  • Demonstrated agreement in silicon isotopic fraction measurements across diverse instruments.
  • Validated the effectiveness of the refined data processing procedures.

Conclusions:

  • Advanced data processing is crucial for high-precision APT analysis of large datasets.
  • The developed methods ensure reliable and reproducible isotopic fraction measurements.
  • This work enables accurate quantitative analysis in atom probe tomography.