Showing results (1-10 of 8) with videos related to
Sort By:
Pageof 1
Applied Optics|June 15, 2012
Parametric uncertainty in nanoscale optical dimensional measurementsJames Potzick, Egon MarxApplied Optics|March 11, 2004
Ray model of light scattering by flake pigments or rough surfaces with smooth transparent coatingsThomas A Germer, Egon MarxJournal of Research of the National Bureau of Standards (1977)|September 27, 2021
Size and Refractive Index Determination of Single Polystyrene SpheresEgon Marx, George W MulhollandJournal of Research of the National Institute of Standards and Technology|February 11, 2017
Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads")Thomas R Lettieri, Arie W Hartman, Gary G Hembree, et al.Journal of Research of the National Bureau of Standards (1977)|September 27, 2021
Development of a One-Micrometer-Diameter Particle Size Standard Reference MaterialG W Mulholland, A W Hartman, G G Hembree, et al.Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.Journal of Research of the National Institute of Standards and Technology|January 6, 2017
X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth MeasurementMichael T Postek, Jeremiah R Lowney, Andras E Vladar, et al.Pageof 1