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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 29, 2017
Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)Etienne Brodu, Emmanuel BouzyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 6, 2018
A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in TransmissionEtienne Brodu, Emmanuel BouzyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 8, 2022
A Pattern Processing Method to Map Nanoscale Phases by EBSDEtienne Brodu, Aimo Winkelmann, Marc SeefeldtMaterials (Basel, Switzerland)|February 21, 2018
A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl AlloyAntoine Guitton, Hana Kriaa, Emmanuel Bouzy, et al.Ultramicroscopy|December 18, 2020
Integrated correction of optical distortions for global HR-EBSD techniquesClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, et al.Microscopy Research and Technique|July 23, 2026
Development of a Pixelated STEM-In-SEM Detector for Microstructural Feature CharacterizationJulien Aubourg, Emmanuel Bouzy, Jean-Jacques Fundenberger, et al.Pageof 1