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ACS Applied Materials & Interfaces|December 22, 2022
Selectivity of Electrochemical Ion Insertion into Manganese Dioxide PolymorphsEvan Z Carlson, William C Chueh, J Tyler Mefford, et al.Physical Chemistry Chemical Physics : PCCP|September 17, 2009
Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densitiesWilliam C Chueh, Sossina M HaileAnnual Review of Chemical and Biomolecular Engineering|April 10, 2012
Electrochemistry of mixed oxygen ion and electron conducting electrodes in solid electrolyte cellsWilliam C Chueh, Sossina M HailePhilosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|June 23, 2010
A thermochemical study of ceria: exploiting an old material for new modes of energy conversion and CO2 mitigationWilliam C Chueh, Sossina M HailePhysical Chemistry Chemical Physics : PCCP|August 23, 2017
Analyzing the dependence of oxygen incorporation current density on overpotential and oxygen partial pressure in mixed conducting oxide electrodesZixuan Guan, Di Chen, William C ChuehPhysical Chemistry Chemical Physics : PCCP|May 9, 2014
Modeling the impedance response of mixed-conducting thin film electrodesChi Chen, Dengjie Chen, William C Chueh, et al.Physical Chemistry Chemical Physics : PCCP|April 21, 2015
Surface electrochemistry of CO2 reduction and CO oxidation on Sm-doped CeO(2-x): coupling between Ce(3+) and carbonate adsorbatesZhuoluo A Feng, Michael L Machala, William C ChuehNature Materials|December 6, 2011
High electrochemical activity of the oxide phase in model ceria-Pt and ceria-Ni composite anodesWilliam C Chueh, Yong Hao, WooChul Jung, et al.Ultramicroscopy|January 23, 2017
Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopyRobert Sinclair, Sang Chul Lee, Yezhou Shi, et al.Ultramicroscopy|March 26, 2017
Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopyRobert Sinclair, Sang Chul Lee, Yezhou Shi, et al.Pageof 6