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Ultramicroscopy
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February 11, 2019
Estimation of elastic strain by integrated image correlation on electron diffraction patterns
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Ultramicroscopy
|
May 12, 2018
Measuring topographies from conventional SEM acquisitions
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Ultramicroscopy
|
September 2, 2017
On the use of SEM correlative tools for in situ mechanical tests
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
February 11, 2019
Estimation of elastic strain by integrated image correlation on electron diffraction patterns
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Ultramicroscopy
|
May 12, 2018
Measuring topographies from conventional SEM acquisitions
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Ultramicroscopy
|
September 2, 2017
On the use of SEM correlative tools for in situ mechanical tests
Qiwei Shi, Stéphane Roux, Félix Latourte, et al.
Page
of 1