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Sensors (Basel, Switzerland)|March 14, 2026
Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin FilmsYaiza Lozano, David Levy, Félix Salazar-BloiseSensors (Basel, Switzerland)|March 16, 2017
Non-Contact Surface Roughness Measurement by Implementation of a Spatial Light ModulatorLaura Aulbach, Félix Salazar Bloise, Min Lu, et al.Sensors (Basel, Switzerland)|August 28, 2025
Analysis of Corrosion by Speckle PolarimetryFrancisco Gascón, Jorge Rodríguez, Ana Bayón, et al.Sensors (Basel, Switzerland)|August 28, 2021
Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron DomainFranziska Pöller, Félix Salazar Bloise, Martin Jakobi, et al.Sensors (Basel, Switzerland)|May 17, 2019
Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization EffectsFranziska Pöller, Félix Salazar Bloise, Martin Jakobi, et al.Optics Express|May 3, 2018
Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysisShengjia Wang, Min Lu, Laura Maria Bilgeri, et al.Applied Optics|January 30, 2019
Dual-directional shearography based on a modified common-path configuration using spatial phase shiftShengjia Wang, Jie Dong, Franziska Pöller, et al.Optics Letters|October 14, 2022
Super-compact shearography based on a single diffractive optical element with 3-in-1 phase maskShengjia Wang, Shuai Gao, Hao Tang, et al.Optics Letters|March 13, 2020
Shear-unlimited common-path speckle interferometerJie Dong, Shengjia Wang, Ali K Yetisen, et al.Optics Express|February 9, 2019
Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurementsJie Dong, Shengjia Wang, Min Lu, et al.Pageof 1