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F D Tichelaar

Showing results (1-10 of 8) with videos related to

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Micron (Oxford, England : 1993)|March 15, 2006
Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si(1-x) Ge(x) nanostructuresR Pantel, M C Cheynet, F D Tichelaar
Journal of Microscopy|January 5, 2000
Effect of electron beam parameters on simulated CBED patterns from edge-on grain boundariesR M Bokel, F D Tichelaar, F W Schapink
Nanotechnology|January 22, 2015
Impact of the atomic layer deposition precursors diffusion on solid-state carbon nanotube based supercapacitors performancesGiuseppe Fiorentino, Sten Vollebregt, F D Tichelaar, et al.
Ultramicroscopy|July 23, 2003
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopyS Lazar, G A Botton, M-Y Wu, et al.
Acta Biomaterialia|March 3, 2011
An electron microscopical study on the growth of TiO2-Ag antibacterial coatings on Ti6Al7Nb biomedical alloyB S Necula, I Apachitei, F D Tichelaar, et al.
Journal of Microscopy|April 29, 2005
Crystallographic analysis of thin specimensV G M Sivel, F D Tichelaar, H Mohdadi, et al.
Dalton Transactions (Cambridge, England : 2003)|June 27, 2019
Downsizing of robust Fe-triazole@SiO<sub>2</sub> spin-crossover nanoparticles with ultrathin shellsR Torres-Cavanillas, L Lima-Moya, F D Tichelaar, et al.
Journal of Microscopy|May 26, 2004
Application of the dual-beam FIB/SEM to metals researchV G M Sivel, J Van den Brand, W R Wang, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Micron (Oxford, England : 1993)|March 15, 2006
Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si(1-x) Ge(x) nanostructuresR Pantel, M C Cheynet, F D Tichelaar
Journal of Microscopy|January 5, 2000
Effect of electron beam parameters on simulated CBED patterns from edge-on grain boundariesR M Bokel, F D Tichelaar, F W Schapink
Nanotechnology|January 22, 2015
Impact of the atomic layer deposition precursors diffusion on solid-state carbon nanotube based supercapacitors performancesGiuseppe Fiorentino, Sten Vollebregt, F D Tichelaar, et al.
Ultramicroscopy|July 23, 2003
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopyS Lazar, G A Botton, M-Y Wu, et al.
Acta Biomaterialia|March 3, 2011
An electron microscopical study on the growth of TiO2-Ag antibacterial coatings on Ti6Al7Nb biomedical alloyB S Necula, I Apachitei, F D Tichelaar, et al.
Journal of Microscopy|April 29, 2005
Crystallographic analysis of thin specimensV G M Sivel, F D Tichelaar, H Mohdadi, et al.
Dalton Transactions (Cambridge, England : 2003)|June 27, 2019
Downsizing of robust Fe-triazole@SiO<sub>2</sub> spin-crossover nanoparticles with ultrathin shellsR Torres-Cavanillas, L Lima-Moya, F D Tichelaar, et al.
Journal of Microscopy|May 26, 2004
Application of the dual-beam FIB/SEM to metals researchV G M Sivel, J Van den Brand, W R Wang, et al.
Pageof 1