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Ultramicroscopy|December 7, 2007
Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)F Houdellier, M J Hÿtch
Ultramicroscopy|January 31, 2017
Optimising electron microscopy experiment through electron optics simulationY Kubo, C Gatel, E Snoeck, et al.
Ultramicroscopy|August 26, 2011
Dark-field electron holography for the measurement of geometric phaseM J Hÿtch, F Houdellier, F Hüe, et al.
Ultramicroscopy|June 5, 2007
Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samplesF Houdellier, D Jacob, M J Casanove, et al.
Ultramicroscopy|July 13, 2007
New approach for the dynamical simulation of CBED patterns in heavily strained specimensF Houdellier, A Altibelli, C Roucau, et al.
Ultramicroscopy|June 6, 2006
Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layersF Houdellier, C Roucau, L Clément, et al.
Ultramicroscopy|May 23, 2007
LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C(s) corrector: comparison with electron precessionJ P Morniroli, F Houdellier, C Roucau, et al.
Ultramicroscopy|January 8, 2018
Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission sourceF Houdellier, G M Caruso, S Weber, et al.
Ultramicroscopy|April 2, 2019
Optimization of off-axis electron holography performed with femtosecond electron pulsesF Houdellier, G M Caruso, S Weber, et al.
Ultramicroscopy|July 10, 2007
Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging techniqueB Warot-Fonrose, F Houdellier, M J Hÿtch, et al.
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