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Ultramicroscopy|March 22, 2016
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projectionC Phatak, L de Knoop, F Houdellier, et al.
Ultramicroscopy|April 22, 2008
Optimal aperture sizes and positions for EMCD experimentsJ Verbeeck, C Hébert, S Rubino, et al.
Ultramicroscopy|July 26, 2014
Dynamical effects in strain measurements by dark-field electron holographyE Javon, A Lubk, R Cours, et al.
Ultramicroscopy|November 13, 2022
A new TCAD simulation method for direct CMOS electron detectors optimizationO Marcelot, C Marcelot, F Corbière, et al.
Ultramicroscopy|December 20, 2014
Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotipF Houdellier, L de Knoop, C Gatel, et al.
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