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F Lorut

Showing results (1-10 of 11) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 26, 2013
Three-dimensional semiconductor device investigation using focused ion beam and scanning electron microscopy imaging (FIB/SEM tomography)K Lepinay, F Lorut
The Review of Scientific Instruments|February 2, 2015
Correction of absorption-edge artifacts in polychromatic X-ray tomography in a scanning electron microscope for 3D microelectronicsD Laloum, T Printemps, F Lorut, et al.
Micron (Oxford, England : 1993)|February 16, 2013
Chemical 3D tomography of 28nm high K metal gate transistor: STEM XEDS experimental method and resultsK Lepinay, F Lorut, R Pantel, et al.
Journal of Microscopy|July 5, 2017
Retrieving overlapping crystals information from TEM nano-beam electron diffraction patternsA Valery, E F Rauch, L Clément, et al.
Micron (Oxford, England : 1993)|December 10, 2013
Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEMD Laloum, F Lorut, J Bertheau, et al.
Micron (Oxford, England : 1993)|November 21, 2016
TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappingsA Valery, A Pofelski, L Clément, et al.
Journal of Microscopy|August 19, 2014
Reduction of the scanning time by total variation minimization reconstruction for X-ray tomography in a SEMD Laloum, T Printemps, D F Sanchez, et al.
The Review of Scientific Instruments|March 8, 2013
Three-dimensional imaging of copper pillars using x-ray tomography within a scanning electron microscope: a simulation study based on synchrotron dataN Martin, J Bertheau, P Bleuet, et al.
Nanotechnology|April 12, 2023
Thermo-desorption measurements during N-doped Ge-rich Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub>crystallizationJ Remondina, A Portavoce, M Bertoglio, et al.
Nanotechnology|April 19, 2022
Kinetic Monte Carlo simulations of Ge-Sb-Te thin film crystallizationA Portavoce, G Roland, J Remondina, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 26, 2013
Three-dimensional semiconductor device investigation using focused ion beam and scanning electron microscopy imaging (FIB/SEM tomography)K Lepinay, F Lorut
The Review of Scientific Instruments|February 2, 2015
Correction of absorption-edge artifacts in polychromatic X-ray tomography in a scanning electron microscope for 3D microelectronicsD Laloum, T Printemps, F Lorut, et al.
Micron (Oxford, England : 1993)|February 16, 2013
Chemical 3D tomography of 28nm high K metal gate transistor: STEM XEDS experimental method and resultsK Lepinay, F Lorut, R Pantel, et al.
Journal of Microscopy|July 5, 2017
Retrieving overlapping crystals information from TEM nano-beam electron diffraction patternsA Valery, E F Rauch, L Clément, et al.
Micron (Oxford, England : 1993)|December 10, 2013
Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEMD Laloum, F Lorut, J Bertheau, et al.
Micron (Oxford, England : 1993)|November 21, 2016
TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappingsA Valery, A Pofelski, L Clément, et al.
Journal of Microscopy|August 19, 2014
Reduction of the scanning time by total variation minimization reconstruction for X-ray tomography in a SEMD Laloum, T Printemps, D F Sanchez, et al.
The Review of Scientific Instruments|March 8, 2013
Three-dimensional imaging of copper pillars using x-ray tomography within a scanning electron microscope: a simulation study based on synchrotron dataN Martin, J Bertheau, P Bleuet, et al.
Nanotechnology|April 12, 2023
Thermo-desorption measurements during N-doped Ge-rich Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub>crystallizationJ Remondina, A Portavoce, M Bertoglio, et al.
Nanotechnology|April 19, 2022
Kinetic Monte Carlo simulations of Ge-Sb-Te thin film crystallizationA Portavoce, G Roland, J Remondina, et al.
Pageof 2