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F Mika
L Frank

Journal of microscopy

Showing results (1-10 of 4) with videos related to

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Journal of Microscopy|April 5, 2008
Two-dimensional dopant profiling with low-energy SEMF Mika, L Frank
Journal of Microscopy|March 2, 2017
About the information depth of backscattered electron imagingJ Piňos, Š Mikmeková, L Frank
Journal of Microscopy|May 23, 2013
Very low energy electron microscopy of graphene flakesE Mikmeková, H Bouyanfif, M Lejeune, et al.
Journal of Microscopy|April 5, 2008
High-pass energy-filtered photoemission electron microscopy imaging of dopants in siliconM Hovorka, L Frank, D Valdaitsev, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|April 5, 2008
Two-dimensional dopant profiling with low-energy SEMF Mika, L Frank
Journal of Microscopy|March 2, 2017
About the information depth of backscattered electron imagingJ Piňos, Š Mikmeková, L Frank
Journal of Microscopy|May 23, 2013
Very low energy electron microscopy of graphene flakesE Mikmeková, H Bouyanfif, M Lejeune, et al.
Journal of Microscopy|April 5, 2008
High-pass energy-filtered photoemission electron microscopy imaging of dopants in siliconM Hovorka, L Frank, D Valdaitsev, et al.
Pageof 1