Showing results (1-10 of 15) with videos related to
Sort By:
Pageof 2
The Review of Scientific Instruments|March 6, 2019
On the characterization of a 1 m long, ultra-precise KB-focusing mirror pair for European XFEL by means of slope measuring deflectometryF Siewert, J Buchheim, G Gwalt, et al.The Review of Scientific Instruments|June 3, 2016
Linear chirped slope profile for spatial calibration in slope measuring deflectometryF Siewert, T Zeschke, T Arnold, et al.Journal of Synchrotron Radiation|September 2, 2014
On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrologyF Siewert, J Buchheim, T Zeschke, et al.Journal of Synchrotron Radiation|December 25, 2015
Growth of nano-dots on the grazing-incidence mirror surface under FEL irradiationI V Kozhevnikov, A V Buzmakov, F Siewert, et al.The Review of Scientific Instruments|June 3, 2016
Ultra-precision fabrication of 500 mm long and laterally graded Ru/C multilayer mirrors for X-ray light sourcesM Störmer, H Gabrisch, C Horstmann, et al.Journal of Synchrotron Radiation|January 5, 2021
Impact of real mirror profiles inside a split-and-delay unit on the spatial intensity profile in pump/probe experiments at the European XFELV Kärcher, S Roling, L Samoylova, et al.The Review of Scientific Instruments|October 3, 2015
A new compact soft x-ray spectrometer for resonant inelastic x-ray scattering studies at PETRA IIIZ Yin, H B Peters, U Hahn, et al.Journal of Synchrotron Radiation|February 28, 2015
Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keVI V Kozhevnikov, E O Filatova, A A Sokolov, et al.The Review of Scientific Instruments|June 3, 2016
At-wavelength metrology facility for soft X-ray reflection opticsA Sokolov, P Bischoff, F Eggenstein, et al.Journal of Synchrotron Radiation|December 25, 2015
The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-IIF Schäfers, P Bischoff, F Eggenstein, et al.Pageof 2