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F Vurpillot

Showing results (11-20 of 25) with videos related to

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Journal of Microscopy|November 30, 2004
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probeF Vurpillot, F De Geuser, G Da Costa, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Ultramicroscopy|December 17, 2010
Investigation of wüstite (Fe1-xO) by femtosecond laser assisted atom probe tomographyM Bachhav, R Danoix, F Danoix, et al.
Ultramicroscopy|August 26, 2011
Pragmatic reconstruction methods in atom probe tomographyF Vurpillot, M Gruber, G Da Costa, et al.
The Journal of Chemical Physics|October 8, 2018
Dissociation of GaN<sup>2+</sup> and AlN<sup>2+</sup> in APT: Electronic structure and stability in strong DC fieldD Zanuttini, F Vurpillot, J Douady, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Ultramicroscopy|March 31, 2015
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materialsN Rolland, D J Larson, B P Geiser, et al.
Ultramicroscopy|March 10, 2015
HAADF-STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopyW Lefebvre, D Hernandez-Maldonado, F Moyon, et al.
Ultramicroscopy|August 18, 2020
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulationsR Dubosq, B Gault, C Hatzoglou, et al.
Ultramicroscopy|May 2, 2017
Atom probe tomography analysis of SiGe fins embedded in SiO<sub>2</sub>: Facts and artefactsD Melkonyan, C Fleischmann, L Arnoldi, et al.
Pageof 3

Showing results (11-20 of 25) with videos related to

Sort By:
Pageof 3
Journal of Microscopy|November 30, 2004
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probeF Vurpillot, F De Geuser, G Da Costa, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Ultramicroscopy|December 17, 2010
Investigation of wüstite (Fe1-xO) by femtosecond laser assisted atom probe tomographyM Bachhav, R Danoix, F Danoix, et al.
Ultramicroscopy|August 26, 2011
Pragmatic reconstruction methods in atom probe tomographyF Vurpillot, M Gruber, G Da Costa, et al.
The Journal of Chemical Physics|October 8, 2018
Dissociation of GaN<sup>2+</sup> and AlN<sup>2+</sup> in APT: Electronic structure and stability in strong DC fieldD Zanuttini, F Vurpillot, J Douady, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Ultramicroscopy|March 31, 2015
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materialsN Rolland, D J Larson, B P Geiser, et al.
Ultramicroscopy|March 10, 2015
HAADF-STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopyW Lefebvre, D Hernandez-Maldonado, F Moyon, et al.
Ultramicroscopy|August 18, 2020
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulationsR Dubosq, B Gault, C Hatzoglou, et al.
Ultramicroscopy|May 2, 2017
Atom probe tomography analysis of SiGe fins embedded in SiO<sub>2</sub>: Facts and artefactsD Melkonyan, C Fleischmann, L Arnoldi, et al.
Pageof 3