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Falk von Seggern

Showing results (1-10 of 4) with videos related to

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ACS Applied Materials & Interfaces|November 2, 2016
Temperature-Dependent Performance of Printed Field-Effect Transistors with Solid Polymer Electrolyte GatingFalk von Seggern, Inna Keskin, Erin Koos, et al.
Nanotechnology|September 10, 2016
Facile fabrication of electrolyte-gated single-crystalline cuprous oxide nanowire field-effect transistorsAnna Stoesser, Falk von Seggern, Suneeti Purohit, et al.
Advanced Materials (Deerfield Beach, Fla.)|November 19, 2016
Sub-50 nm Channel Vertical Field-Effect Transistors using Conventional Ink-Jet PrintingTessy Theres Baby, Manuel Rommel, Falk von Seggern, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2019
Electron Beam Effects on Oxide Thin Films-Structure and Electrical Property CorrelationsKrishna Kanth Neelisetty, Xiaoke Mu, Sebastian Gutsch, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|November 2, 2016
Temperature-Dependent Performance of Printed Field-Effect Transistors with Solid Polymer Electrolyte GatingFalk von Seggern, Inna Keskin, Erin Koos, et al.
Nanotechnology|September 10, 2016
Facile fabrication of electrolyte-gated single-crystalline cuprous oxide nanowire field-effect transistorsAnna Stoesser, Falk von Seggern, Suneeti Purohit, et al.
Advanced Materials (Deerfield Beach, Fla.)|November 19, 2016
Sub-50 nm Channel Vertical Field-Effect Transistors using Conventional Ink-Jet PrintingTessy Theres Baby, Manuel Rommel, Falk von Seggern, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2019
Electron Beam Effects on Oxide Thin Films-Structure and Electrical Property CorrelationsKrishna Kanth Neelisetty, Xiaoke Mu, Sebastian Gutsch, et al.
Pageof 1