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Felix Börrnert

Showing results (1-10 of 30) with videos related to

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Micron (Oxford, England : 1993)|February 16, 2026
Depth of field in phase-contrast transmission electron microscopyFelix Börrnert
Micron (Oxford, England : 1993)|August 16, 2016
Thoughts about next-generation (S)TEM instruments in scienceFelix Börrnert
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 22, 2018
Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron MicroscopeFelix Börrnert, Julian Renner, Ute Kaiser
Physical Review Letters|November 12, 2013
Transport of intensity phase retrieval of arbitrary wave fields including vorticesAxel Lubk, Giulio Guzzinati, Felix Börrnert, et al.
Ultramicroscopy|July 17, 2023
A novel ground-potential monochromator designFelix Börrnert, Stephan Uhlemann, Heiko Müller, et al.
Angewandte Chemie (International Ed. in English)|June 1, 2017
Thermal Disproportionation of Oxo-Functionalized GrapheneFabian Grote, Christoph Gruber, Felix Börrnert, et al.
ACS Nano|November 1, 2012
Programmable sub-nanometer sculpting of graphene with electron beamsFelix Börrnert, Lei Fu, Sandeep Gorantla, et al.
Ultramicroscopy|February 11, 2014
A cheap and quickly adaptable in situ electrical contacting TEM sample holder designFelix Börrnert, Ralf Voigtländer, Bernd Rellinghaus, et al.
Scientific Reports|June 15, 2016
A new bifunctional hybrid nanostructure as an active platform for photothermal therapy and MR imagingMona Khafaji, Manouchehr Vossoughi, M Reza Hormozi-Nezhad, et al.
Ultramicroscopy|March 24, 2019
The Dresden in-situ (S)TEM special with a continuous-flow liquid-helium cryostatFelix Börrnert, Felix Kern, Franziska Harder, et al.
Pageof 3

Showing results (1-10 of 30) with videos related to

Sort By:
Pageof 3
Micron (Oxford, England : 1993)|February 16, 2026
Depth of field in phase-contrast transmission electron microscopyFelix Börrnert
Micron (Oxford, England : 1993)|August 16, 2016
Thoughts about next-generation (S)TEM instruments in scienceFelix Börrnert
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 22, 2018
Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron MicroscopeFelix Börrnert, Julian Renner, Ute Kaiser
Physical Review Letters|November 12, 2013
Transport of intensity phase retrieval of arbitrary wave fields including vorticesAxel Lubk, Giulio Guzzinati, Felix Börrnert, et al.
Ultramicroscopy|July 17, 2023
A novel ground-potential monochromator designFelix Börrnert, Stephan Uhlemann, Heiko Müller, et al.
Angewandte Chemie (International Ed. in English)|June 1, 2017
Thermal Disproportionation of Oxo-Functionalized GrapheneFabian Grote, Christoph Gruber, Felix Börrnert, et al.
ACS Nano|November 1, 2012
Programmable sub-nanometer sculpting of graphene with electron beamsFelix Börrnert, Lei Fu, Sandeep Gorantla, et al.
Ultramicroscopy|February 11, 2014
A cheap and quickly adaptable in situ electrical contacting TEM sample holder designFelix Börrnert, Ralf Voigtländer, Bernd Rellinghaus, et al.
Scientific Reports|June 15, 2016
A new bifunctional hybrid nanostructure as an active platform for photothermal therapy and MR imagingMona Khafaji, Manouchehr Vossoughi, M Reza Hormozi-Nezhad, et al.
Ultramicroscopy|March 24, 2019
The Dresden in-situ (S)TEM special with a continuous-flow liquid-helium cryostatFelix Börrnert, Felix Kern, Franziska Harder, et al.
Pageof 3