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Filadelfo Cristiano

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 11, 2020
An Improved STEM/EDX Quantitative Method for Dopant Profiling at the NanoscaleRaghda Makarem, Filadelfo Cristiano, Dominique Muller, et al.
ACS Omega|February 28, 2022
Large-Scale Monolithic Fabrication of III-V Vertical Nanowires on a Standard Si(100) Microelectronic SubstrateAurélie Lecestre, Mickael Martin, Filadelfo Cristiano, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si<sub>1-</sub><i></i> Ge <i></i> and Si layersRichard Daubriac, Emmanuel Scheid, Hiba Rizk, et al.
Chempluschem|November 28, 2023
β-Disubstituted Pentacene Derivatives: Thin Film Structural Properties and Four-Probe Field Effect MobilityMouaad-Yassine Aliouat, Filadelfo Cristiano, Lydia Abbassi, et al.
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Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 11, 2020
An Improved STEM/EDX Quantitative Method for Dopant Profiling at the NanoscaleRaghda Makarem, Filadelfo Cristiano, Dominique Muller, et al.
ACS Omega|February 28, 2022
Large-Scale Monolithic Fabrication of III-V Vertical Nanowires on a Standard Si(100) Microelectronic SubstrateAurélie Lecestre, Mickael Martin, Filadelfo Cristiano, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si<sub>1-</sub><i></i> Ge <i></i> and Si layersRichard Daubriac, Emmanuel Scheid, Hiba Rizk, et al.
Chempluschem|November 28, 2023
β-Disubstituted Pentacene Derivatives: Thin Film Structural Properties and Four-Probe Field Effect MobilityMouaad-Yassine Aliouat, Filadelfo Cristiano, Lydia Abbassi, et al.
Pageof 1