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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron MicroscopeFrances Quigley, Clive Downing, Cormac McGuinness, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys JonesMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 31, 2022
Cost and Capability Compromises in STEM Instrumentation for Low-Voltage ImagingFrances Quigley, Patrick McBean, Peter O'Donovan, et al.ACS Omega|January 16, 2023
Templated Synthesis of SiO<sub>2</sub> Nanotubes for Lithium-Ion Battery Applications: An In Situ (Scanning) Transmission Electron Microscopy StudyOskar Ronan, Ahin Roy, Sean Ryan, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D NellistMicron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D NellistACS Applied Materials & Interfaces|January 26, 2019
Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion LayersWilliam M Abbott, Christopher P Murray, Chuan Zhong, et al.Acta Biomaterialia|May 25, 2019
Adverse effects of nanosilver on human health and the environmentEhsan Rezvani, Aran Rafferty, Cormac McGuinness, et al.Open Research Europe|August 30, 2023
Inhibition of vacuum sublimation artefacts for (Scanning) Transmission Electron Microscopy ((S)TEM) of sulphur samples <i>via</i> encapsulationOskar Ronan, Clive Downing, Valeria NicolosiScientific Reports|May 13, 2025
Rapid eigenpatch utility classifier for image denoisingMichael A J Mitchell, Stefano Sanvito, Lewys JonesPageof 8