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Identifying and correcting scan noise and drift in the scanning transmission electron microscope

Lewys Jones1, Peter D Nellist

  • 1Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK. lewys.jones@materials.ox.ac.uk

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 16, 2013
PubMed

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